SJ 50033/154-2002 半导体分立器件 3DG251型硅超高频低噪声晶体管详细规范
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时间:2024-05-05 15:15:04
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基本信息
标准名称: | 半导体分立器件 3DG251型硅超高频低噪声晶体管详细规范 |
英文名称: | Semiconductor discrete devices Detail specification for type 3DG251 silicon UHF low-noise transistor |
中标分类: |
电子元器件与信息技术 >>
半导体分立器件 >>
半导体分立器件综合 |
发布部门: | 中华人民共和国信息产业部 |
发布日期: | 2002-10-30 |
实施日期: | 2003-03-01 |
首发日期: | 1900-01-01 |
作废日期: | 1900-01-01 |
提出单位: | 中华人民共和国信息产业部 |
归口单位: | 信息产业部电子第四研究所 |
起草单位: | 中国电子科技集团公司第十三所 |
起草人: | 高林颖、王于辉、催波 |
出版社: | 中国电子工业出版社 |
出版日期: | 2003-03-01 |
页数: | 9页 |
适用范围
本规范规定了3DG251超高频低噪声晶体管的详细要求。本规范适用于器件的研制、生产和采购。
前言
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目录
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引用标准
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所属分类: 电子元器件与信息技术 半导体分立器件 半导体分立器件综合
【英文标准名称】:Photography(Film)-PhotographicSheetFilms-DesignationofEmulsionSide
【原文标准名称】:摄影(胶片).摄影胶片.感光乳剂面的名称和符号
【标准号】:ANSIPH1.19-1990
【标准状态】:作废
【国别】:美国
【发布日期】:1990
【实施或试行日期】:
【发布单位】:美国国家标准学会(ANSI)
【起草单位】:ANSI
【标准类型】:()
【标准水平】:()
【中文主题词】:摄影胶片;摄影;标识
【英文主题词】:photographicfilm;photography;designations
【摘要】:
【中国标准分类号】:G81
【国际标准分类号】:37_040_20
【页数】:1P;A4
【正文语种】:英语
【英文标准名称】:StandardTestMethodforDielectricBreakdownVoltageandDielectricStrengthofSolidElectricalInsulatingMaterialsatCommercialPowerFrequencies
【原文标准名称】:固体电绝缘材料在商用电源频率下的介电击穿电压和介电强度的标准试验方法
【标准号】:ASTMD149-2009
【标准状态】:现行
【国别】:美国
【发布日期】:2009
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:D09.12
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:
【英文主题词】:breakdown;breakdownvoltage;calibration;criteriaofbreakdown;dielectricbreakdownvoltage;dielectricfailure;dielectricstrength;electrodes;flashover;powerfrequency;process-controltesting;prooftesting;quality-controltesting;
【摘要】:Thedielectricstrengthofanelectricalinsulatingmaterialisapropertyofinterestforanyapplicationwhereanelectricalfieldwillbepresent.Inmanycasesthedielectricstrengthofamaterialwillbethedeterminingfactorinthedesignoftheapparatusinwhichitistobeused.Testsmadeasspecifiedhereinaresuitableforusetoprovidepartoftheinformationneededfordeterminingsuitabilityofamaterialforagivenapplication;andalso,fordetectingchangesordeviationsfromnormalcharacteristicsresultingfromprocessingvariables,agingconditions,orothermanufacturingorenvironmentalsituations.Thistestmethodisusefulforprocesscontrol,acceptanceorresearchtesting.Resultsobtainedbythistestmethodcanseldombeuseddirectlytodeterminethedielectricbehaviorofamaterialinanactualapplication.Inmostcasesitisnecessarythattheseresultsbeevaluatedbycomparisonwithresultsobtainedfromotherfunctionaltestsorfromtestsonothermaterials,orboth,inordertoestimatetheirsignificanceforaparticularmaterial.ThreemethodsforvoltageapplicationarespecifiedinSection12:MethodA,Short-TimeTest;MethodB,Step-by-StepTest;andMethodC,SlowRate-of-RiseTest.MethodAisthemostcommonly-usedtestforquality-controltests.However,thelonger-timetests,MethodsBandC,whichusuallywillgivelowertestresults,willpotentiallygivemoremeaningfulresultswhendifferentmaterialsarebeingcomparedwitheachother.Ifatestsetwithmotor-drivenvoltagecontrolisavailable,theslowrate-of-risetestissimplerandpreferabletothestep-by-steptest.TheresultsobtainedfromMethodsBandCarecomparabletoeachother.Documentsspecifyingtheuseofthistestmethodshallalsospecify:Methodofvoltageapplication,Voltagerate-of-rise,ifslowrate-of-risemethodisspecified,Specimenselection,preparation,andconditioning,Surroundingmediumandtemperatureduringtest,Electrodes,Whereverpossible,thefailurecriterionofthecurrent-sensingelement,andAnydesireddeviationsfromtherecommendedproceduresasgiven.Ifanyoftherequirementslistedin5.5aremissingfromthespecifyingdocument,thentherecommendationsfortheseveralvariablesshallbefollowed.Unlesstheitemslistedin5.5arespecified,testsmadewithsuchinadequatereferencetothistestmethodarenotinconformancewiththistestmethod.Iftheitemslistedin5.5arenotcloselycontrolledduringthetest,itispossiblethattheprecisionsstatedin15.2and15.3willnotbeobtained.Variationsinthefailurecriteria(currentsettingandresponsetime)ofthecurrentsensingelementsignificantlyaffectthetestresults.AppendixX1.containsamorecompletediscussionofthesignificanceofdielectricstrengthtests.1.1Thistestmethodcoversproceduresforthedeterminationofdielectricstrengthofsolidinsulatingmaterialsatcommercialpowerfrequencies,underspecifiedconditions.,1.2Unlessotherwisespecified,thetestsshallbemadeat60Hz.However,thistestmethodissuitableforuseatanyfrequencyfrom25to800Hz.Atfrequenciesabove800Hz,dielectricheatingisapotentialproblem.1.3ThistestmethodisintendedtobeusedinconjunctionwithanyASTMstandardorotherdocumentthatreferstothistestmethod.Referencestothisdocumentneedtospecifytheparticularoptionstobeused(see5.5).1.4Itissuitableforuseatvarioustemperatures,andinanysuitablegaseousorliquidsurroundingmedium.1.5Thistestmethodisnotintendedformeasuringthedielectricstrengthofmaterialsthatarefluidundertheconditionsoftest.1.6Thistestmetho......
【中国标准分类号】:K15
【国际标准分类号】:
【页数】:13P.;A4
【正文语种】:英语